Structure and Properties of a Bilayer Nanodimensional CoSi2/Si/CoSi2/Si System Obtained by Ion Implantation
Crossref DOI link: https://doi.org/10.1134/S1063784218120058
Published Online: 2019-01-28
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ergashov, Y. S.
Umirzakov, B. E.
Text and Data Mining valid from 2018-12-01
Article History
Received: 13 January 2018
First Online: 28 January 2019