In Situ Modification and Analysis of the Composition and Crystal Structure of a Silicon Target by Ion-Beam Methods
Crossref DOI link: https://doi.org/10.1134/S106378421812023X
Published Online: 2019-01-28
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Balakshin, Yu. V.
Shemukhin, A. A.
Nazarov, A. V.
Kozhemiako, A. V.
Chernysh, V. S.
Text and Data Mining valid from 2018-12-01
Article History
Received: 31 March 2018
First Online: 28 January 2019