Microscopic Examination of the Silicon Surface Subjected to High-Dose Silver Implantation
Crossref DOI link: https://doi.org/10.1134/S1063784219020270
Published Online: 2019-05-06
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vorob’ev, V. V.
Rogov, A. M.
Osin, Yu. N.
Nuzhdin, V. I.
Valeev, V. F.
Eidel’man, K. B.
Tabachkova, N. Yu.
Ermakov, M. A.
Stepanov, A. L.
Text and Data Mining valid from 2019-02-01
Article History
Received: 9 April 2018
First Online: 6 May 2019