X-Ray Diagnostics of Microstructure Defects of Silicon Crystals Irradiated by Hydrogen Ions
Crossref DOI link: https://doi.org/10.1134/S1063784219050049
Published Online: 2019-06-13
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Asadchikov, V. E.
D’yachkova, I. G.
Zolotov, D. A.
Krivonosov, Yu. S.
Chukhovskii, F. N.
Text and Data Mining valid from 2019-05-01
Version of Record valid from 2019-05-01
Article History
Received: 25 September 2018
Revised: 25 September 2018
Accepted: 23 October 2018
First Online: 13 June 2019