Technique for Investigation of the Shape Changes of Wafers and Thin-Film Membranes by Using Geomorphometric Approaches
Crossref DOI link: https://doi.org/10.1134/S1063784224010080
Published Online: 2024-09-02
Published Print: 2024-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dedkova, A. A.
Florinsky, I. V.
Djuzhev, N. A.
Text and Data Mining valid from 2024-02-01
Version of Record valid from 2024-02-01
Article History
Received: 16 April 2022
Revised: 16 April 2022
Accepted: 16 April 2022
First Online: 2 September 2024
CONFLICT OF INTEREST
: The authors declare that they have no conflict of interest.