Investigation of the Filament Properties in the HfO2-Based Structures Using Conductive Atomic Force Microscopy
Crossref DOI link: https://doi.org/10.1134/S1063784224070181
Published Online: 2024-09-27
Published Print: 2024-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Isaev, A. G.
Permiakova, O. O.
Rogozhin, A. E.
Text and Data Mining valid from 2024-07-01
Version of Record valid from 2024-07-01
Article History
Received: 18 January 2023
Revised: 19 May 2023
Accepted: 16 June 2023
First Online: 27 September 2024
CONFLICT OF INTEREST
: The authors declare that they have no conflict of interest.