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Analysis of stacking faults in gallium nitride by Fourier transform of high-resolution images

Crossref DOI link: https://doi.org/10.1134/S106378501412027X

Published Online: 2015-01-09

Published Print: 2014-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kirilenko, D. A.

Sitnikova, A. A.

Kremleva, A. V.

Mynbaeva, M. G.

Nikolaev, V. I.
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