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Atomic and electronic structure peculiarities of silicon wires formed on substrates with varied resistivity according to ultrasoft X-ray emission spectroscopy

Crossref DOI link: https://doi.org/10.1134/S106378501504015X

Published Online: 2015-05-13

Published Print: 2015-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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