Crossmark

The effect of irradiation with H+ and Ne+ ions on resistive switching in metal–insulator–metal memristive structures based on SiO x

Published Online: 2015-11-05

Published Print: 2015-10

Authors

Belov, A. I.

Mikhaylov, A. N.

Korolev, D. S.

Sergeev, V. A.

Okulich, E. V.

Antonov, I. N.

Kasatkin, A. P.

Gryaznov, E. G.

Yatmanov, A. P.

Gorshkov, O. N.

Tetelbaum, D. I.
License Information

Text and Data Mining valid from 2015-10-01

Version of Record valid from 2015-10-01
More Information

Article History

Received: 5 May 2015

First Online: 5 November 2015

Document is current