The role of crystallographic anisotropy in formation of the structure of silicon-implanted layers of NiTi single crystals
Crossref DOI link: https://doi.org/10.1134/S1063785016030299
Published Online: 2016-05-15
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Poletika, T. M.
Meisner, L. L.
Girsova, S. L.
Tverdokhlebova, A. V.
Meisner, S. N.
Text and Data Mining valid from 2016-03-01