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The relationship between the reliability of transistors with 2D AlGaN/GaN channel and organization type of nanomaterial

Published Online: 2016-08-12

Published Print: 2016-07

Authors

Emtsev, V. V.

Zavarin, E. E.

Oganesyan, G. A.

Petrov, V. N.

Sakharov, A. V.

Shmidt, N. M.

V’yuginov, V. N.

Zybin, A. A.

Parnes, Ya. M.

Vidyakin, S. I.

Gudkov, A. G.

Chernyakov, A. E.
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Text and Data Mining valid from 2016-07-01

Version of Record valid from 2016-07-01
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Article History

Received: 11 February 2016

First Online: 12 August 2016

Document is current