Quantum efficiency of 4H-SiC detectors within the range of 114–400 nm
Crossref DOI link: https://doi.org/10.1134/S1063785016100229
Published Online: 2016-11-06
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kalinina, E. V.
Violina, G. N.
Belik, V. P.
Nikolaev, A. V.
Zabrodskii, V. V.
License valid from 2016-10-01