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Photoemission studies of the vicinal SiC(100) 4° surface and the Cs/SiC(100) 4° interface

Crossref DOI link: https://doi.org/10.1134/S1063785016120026

Published Online: 2017-01-06

Published Print: 2016-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Benemanskaya, G. V.

Dementev, P. A.

Kukushkin, S. A.

Lapushkin, M. N.

Osipov, A. V.

Timoshnev, S. N.
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License valid from 2016-12-01