Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry
Crossref DOI link: https://doi.org/10.1134/S1063785017050170
Published Online: 2017-06-16
Published Print: 2017-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Drozdov, M. N.
Danil’tsev, V. M.
Drozdov, Yu. N.
Khrykin, O. I.
Yunin, P. A.
License valid from 2017-05-01