Precise Magnetometric Diagnostics of Critical-Current Inhomogeneities in High-Temperature Semiconductor Tapes
Crossref DOI link: https://doi.org/10.1134/S1063785017120240
Published Online: 2018-02-05
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Podlivaev, A. I.
Pokrovskii, S. V.
Anischenko, I. V.
Rudnev, I. A.
Text and Data Mining valid from 2017-12-01
Article History
Received: 5 July 2017
First Online: 5 February 2018