Correlated Variation of Electrical Characteristics of a Thin-Film Field-Effect Transistor during Modification of the Physical Properties of an InZnO:N Oxide Semiconductor Channel
Crossref DOI link: https://doi.org/10.1134/S1063785018100188
Published Online: 2018-12-15
Published Print: 2018-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cheremisin, A. B.
Kuldin, N. A.
Text and Data Mining valid from 2018-10-01
Article History
Received: 15 March 2018
First Online: 15 December 2018