Document is current

Any future updates will be listed below

Comparative Photoluminescent Analysis of Point Defects in SiO2 Induced by Implantation of Ar+ Ions and Neutron Irradiation

Crossref DOI link: https://doi.org/10.1134/S1063785019030155

Published Online: 2019-05-06

Published Print: 2019-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark