Filamentation and Self-Focusing of Electron Beams in Vacuum and Gas Diodes
Crossref DOI link: https://doi.org/10.1134/S1063785019040023
Published Online: 2019-05-31
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Oleshko, V. I.
Tarasenko, V. F.
Burachenko, A. G.
Nguyen, V. V.
Text and Data Mining valid from 2019-04-01
Version of Record valid from 2019-04-01
Article History
Received: 12 December 2018
Revised: 12 December 2018
Accepted: 27 December 2018
First Online: 31 May 2019