Crossmark

The Influence of a Single Charged Interface Trap on the Subthreshold Drain Current in FinFETs with Different Fin Shapes

Published Online: 2020-06-15

Published Print: 2020-05

Authors

Abdikarimov, A. E.
License Information

Text and Data Mining valid from 2020-05-01

Version of Record valid from 2020-05-01
More Information

Article History

Received: 3 October 2019

Revised: 2 March 2020

Accepted: 2 March 2020

First Online: 15 June 2020

CONFLICT OF INTEREST

: The authors declare that they have no conflict of interest.

Document is current