The Influence of Metal Masks on Matching of the Lower Electrode and a High-Frequency Bias Generator at Reactive Ion Etching of Large Substrates
Crossref DOI link: https://doi.org/10.1134/S1063785021060122
Published Online: 2021-12-16
Published Print: 2021-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Poletayev, S. D.
Lyubimov, A. I.
Text and Data Mining valid from 2021-08-01
Version of Record valid from 2021-08-01
Article History
Received: 25 January 2021
Revised: 12 March 2021
Accepted: 12 March 2021
First Online: 16 December 2021
CONFLICT OF INTEREST
: The authors declare that they have no conflicts of interest.