Tunnel current and I–V characteristics of vacuum extremely-high-frequency microelectronic structures
Crossref DOI link: https://doi.org/10.1134/S1064226915020023
Published Online: 2015-02-13
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bushuev, N. A.
Text and Data Mining valid from 2015-02-01
Version of Record valid from 2015-02-01
Article History
Received: 18 September 2013
First Online: 13 February 2015