Simulation of the impact of heavy charged particles on the characteristics of field-effect silicon-on-insulator transistors
Crossref DOI link: https://doi.org/10.1134/S1064226915070074
Published Online: 2015-10-17
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Glushko, A. A.
Zinchenko, L. A.
Shakhnov, V. A.
Text and Data Mining valid from 2015-10-01