Experimental study of burnout of microwave bipolar transistors under action of a series of electric pulses
Crossref DOI link: https://doi.org/10.1134/S1064226916070093
Published Online: 2016-07-22
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sasunkevich, A. A.
Sorokin, L. N.
Usychenko, V. G.
License valid from 2016-07-01