Capacitive Properties of Metal–Insulator–Semiconductor Systems Based on an HgCdTe nBn Structure Grown by Molecular Beam Epitaxy
Crossref DOI link: https://doi.org/10.1134/S1064226919030197
Published Online: 2019-06-03
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Voitsekhovskii, A. V.
Nesmelov, S. N.
Dzyadukh, S. M.
Dvoretsky, S. A.
Mikhailov, N. N.
Sidorov, G. Yu.
Yakushev, M. V.
Text and Data Mining valid from 2019-03-01
Version of Record valid from 2019-03-01
Article History
Received: 29 May 2018
Revised: 16 June 2018
Accepted: 21 June 2018
First Online: 3 June 2019