A Study of Electronic Structure of Diethyldiphenylsilane by X-Ray Emission Spectroscopy and Density Functional Theory Methods
Crossref DOI link: https://doi.org/10.1134/S1070363219110100
Published Online: 2019-12-28
Published Print: 2019-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Danilenko, T. N.
Tatevosyan, M. M.
Vlasenko, V. G.
Text and Data Mining valid from 2019-11-01
Version of Record valid from 2019-11-01
Article History
Received: 18 April 2019
Revised: 18 April 2019
Accepted: 22 April 2019
First Online: 28 December 2019