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Effect of Vacuum Annealing on the Microstructure and Optoelectronic Properties of AZO Thin Films Deposited on Glass Substrates via Confocal RF Magnetron Sputtering

Crossref DOI link: https://doi.org/10.1134/S1087659625600358

Published Online: 2026-02-20

Published Print: 2025-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Chibani Ouissem,

Touam, Tahar

Chelouche, Azeddine

Challali, Fatiha
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Text and Data Mining valid from 2025-10-01

Version of Record valid from 2025-10-01
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Article History

Received: 22 April 2025

Revised: 25 July 2025

Accepted: 25 September 2025

First Online: 20 February 2026

CONFLICT OF INTEREST

: The authors of this work declare that they have no conflicts of interest.

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