Single electronic traps in tin and zinc oxides
Crossref DOI link: https://doi.org/10.1134/S1995078014020086
Published Online: 2014-04-30
Published Print: 2014-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Grishin, M. V.
Gatin, A. K.
Dokhlikova, N. V.
Kirsankin, A. A.
Kharitonov, V. A.
Belysheva, T. V.
Trakhtenberg, L. I.
Shub, B. R.
Text and Data Mining valid from 2014-03-01
Version of Record valid from 2014-03-01
Article History
Received: 4 February 2013
Accepted: 12 December 2013
First Online: 30 April 2014