Estimation of the thickness of graphite nanofilm on a silicon substrate by using energy dispersive X-ray analysis data
Crossref DOI link: https://doi.org/10.1134/S1995078016040182
Published Online: 2016-08-12
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Timofeeva, T. E.
Timofeev, V. B.
Popov, V. I.
Smagulova, S. A.
License valid from 2016-07-01