Injection modification of multilayer dielectric layers of metal-oxide-semiconductor structures at different temperatures
Crossref DOI link: https://doi.org/10.1134/S2075113314020038
Published Online: 2014-04-27
Published Print: 2014-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Andreev, V. V.
Bondarenko, G. G.
Stolyarov, A. A.
Korotkov, S. I.
Text and Data Mining valid from 2014-03-01