Technique of Control of the Gate Dielectric of MIS Structures Based on High-Field Charge Injection
Crossref DOI link: https://doi.org/10.1134/S2075113322020058
Published Online: 2022-04-20
Published Print: 2022-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Andreev, D. V.
Text and Data Mining valid from 2022-04-01
Version of Record valid from 2022-04-01
Article History
Received: 10 August 2020
Revised: 12 September 2020
Accepted: 13 September 2020
First Online: 20 April 2022