Constructing a Sequence Detecting Robustly Testable Path Delay Faults in Sequential Circuits
Crossref DOI link: https://doi.org/10.1134/S0005117921110102
Published Online: 2021-12-22
Published Print: 2021-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Matrosova, A. Yu.
Chernyshov, S. V.
Kim, O. Kh.
Nikolaeva, E. A.
Text and Data Mining valid from 2021-11-01
Version of Record valid from 2021-11-01
Article History
Received: 22 May 2020
Revised: 1 February 2021
Accepted: 16 March 2021
First Online: 22 December 2021