Temporal response of silicon EUV and soft X-ray detectors
Crossref DOI link: https://doi.org/10.1134/S0020441215010017
Published Online: 2015-02-17
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Artyomov, A. P.
Baksht, E. H.
Tarasenko, V. F.
Fedunin, A. V.
Chaikovsky, S. A.
Aruev, P. N.
Zabrodskii, V. V.
Petrenko, M. V.
Sobolev, N. A.
Suhanov, V. L.
Text and Data Mining valid from 2015-01-01