The use of lamb waves for measuring the thicknesses of thin metal films
Crossref DOI link: https://doi.org/10.1134/S0020441217020142
Published Online: 2017-04-20
Published Print: 2017-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tolipov, Kh. B.
Kleshchev, D. G.
Berezin, V. M.
License valid from 2017-03-01