A Method for Reducing the Threshold Dose of Irradiation with Hydrogen Ions for Forming Blisters in Silicon
Crossref DOI link: https://doi.org/10.1134/S0020441218020197
Published Online: 2018-04-17
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Reutov, V. F.
Dmitriev, S. N.
Zaluzhnyi, A. G.
Text and Data Mining valid from 2018-03-01
Article History
Received: 4 April 2017
Accepted: 6 October 2017
First Online: 17 April 2018