Ellipsometric in situ diagnostics of the growth of porous anodic oxide films on aluminum
Crossref DOI link: https://doi.org/10.1134/S0030400X15020162
Published Online: 2015-02-28
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shvets, V. A.
Kruchinin, V. N.
Rykhlitskii, S. V.
Prokop’ev, V. Yu.
Uvarov, N. F.
Text and Data Mining valid from 2015-02-01