A study of the effect of residual stress on magnetic properties of Fe-Ni thin film using a synchrotron X-ray
Crossref DOI link: https://doi.org/10.1134/S0031918X14130092
Published Online: 2014-12-24
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, C. W.
Cho, K. H.
Suk, H. G.
Text and Data Mining valid from 2014-12-01