Influence of deposition conditions on electrical and mechanical properties of Sm2O3-doped CeO2 thin films prepared by EB-PVD (+IBAD) methods. Relationship between investigated film and substrate at indentation
Crossref DOI link: https://doi.org/10.1134/S102319351506004X
Published Online: 2015-06-18
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Buršíková, V.
Hartmanová, M.
Navrátil, V.
Mansilla, C.
Text and Data Mining valid from 2015-06-01