Studying the surface layers of products using a low-vacuum scanning electron microscope
Crossref DOI link: https://doi.org/10.1134/S1027451014060056
Published Online: 2014-12-05
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Feldshtein, E.
Kowalewski, P.
Dyachkova, L.
Text and Data Mining valid from 2014-11-01