Dependence between the defocusing of the low-voltage SEM probe and its electron-density distribution
Crossref DOI link: https://doi.org/10.1134/S1027451014060135
Published Online: 2014-12-05
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Novikov, Yu. A.
Text and Data Mining valid from 2014-11-01