Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy
Crossref DOI link: https://doi.org/10.1134/S1027451014060378
Published Online: 2015-02-05
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mikhailovskii, V. Yu.
Petrov, Yu. V.
Vyvenko, O. F.
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