Role of the recoil atom energy in the formation of radiation-induced defects in semiconductors under electron bombardment
Crossref DOI link: https://doi.org/10.1134/S1027451015020123
Published Online: 2015-04-15
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kozlovski, V. V.
Vasil’ev, A. E.
Lebedev, A. A.
Text and Data Mining valid from 2015-03-01