On the use of an external reference sample in the X-ray diffraction analysis of epitaxial layers
Crossref DOI link: https://doi.org/10.1134/S1027451016010109
Published Online: 2016-02-19
Published Print: 2016-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Drozdov, Yu. N.
Yunin, P. A.
Text and Data Mining valid from 2016-01-01