Investigation of X-ray diffraction limitations upon the analysis of tellurium-atom injection into GaAs epitaxial layers
Crossref DOI link: https://doi.org/10.1134/S1027451017020069
Published Online: 2017-04-27
Published Print: 2017-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Drozdov, Yu. N.
Danil’tsev, V. M.
Drozdov, M. N.
Yunin, P. A.
Demidov, E. V.
Folomin, P. I.
Gritsenko, A. B.
Korolev, S. A.
Surovegina, E. A.
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