On the Precision Preparation of Samples for Atom Probe Tomography Using a Focused Ion Beam in a SEM
Crossref DOI link: https://doi.org/10.1134/S1027451017060106
Published Online: 2018-04-02
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Khoroshilov, V. V.
Korchuganova, O. A.
Lukyanchuk, A. A.
Raznitsyn, O. A.
Aleev, A. A.
Rogozhkin, S. V.
Text and Data Mining valid from 2018-01-01
Article History
Received: 22 June 2017
First Online: 2 April 2018