Charge Effects in the Dielectric Films of MIS Structures under the Concurrent Influence of Radiation and High-Field Electron Injection
Crossref DOI link: https://doi.org/10.1134/S1027451020020196
Published Online: 2020-05-07
Published Print: 2020-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Andreev, D. V.
Bondarenko, G. G.
Andreev, V. V.
Maslovsky, V. M.
Stolyarov, A. A.
Text and Data Mining valid from 2020-03-01
Version of Record valid from 2020-03-01
Article History
Received: 17 August 2019
Revised: 2 September 2019
Accepted: 5 September 2019
First Online: 7 May 2020