Modern Scanning Electron Microscopy. 2. Test Objects for Scanning Electron Microscopy
Crossref DOI link: https://doi.org/10.1134/S102745102306040X
Published Online: 2023-12-08
Published Print: 2023-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Novikov, Yu. A.
Text and Data Mining valid from 2023-12-01
Version of Record valid from 2023-12-01
Article History
Received: 20 December 2022
Revised: 24 February 2023
Accepted: 24 February 2023
First Online: 8 December 2023
CONFLICT OF INTEREST
: The author states that he has no conflicts of interest.