Electromigration-Induced Instability of the Interface between Solid Conductors
Crossref DOI link: https://doi.org/10.1134/S102995991804001X
Published Online: 2018-08-17
Published Print: 2018-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Goldstein, R. V.
Makhviladze, T. M.
Sarychev, M. E.
Text and Data Mining valid from 2018-07-01
Article History
Received: 1 June 2016
First Online: 17 August 2018