Analyzing flaws in electric components by scanning acoustic microscopy
Crossref DOI link: https://doi.org/10.1134/S1061830917090042
Published Online: 2017-11-25
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Burov, R. B.
Stoyanov, A. A.
Vinokurov, A. A.
Zenin, V. V.
License valid from 2017-09-01