Isotopic Analysis of Highly Enriched Crystalline 28Si and Initial 28SiF4 by High-Resolution Inductively Coupled Plasma Mass Spectrometry
Crossref DOI link: https://doi.org/10.1134/S1061934819130100
Published Online: 2019-12-30
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Otopkova, P. A.
Potapov, A. M.
Suchkov, A. I.
Bulanov, A. D.
Lashkov, A. Yu.
Kurganova, A. E.
Text and Data Mining valid from 2019-12-01
Version of Record valid from 2019-12-01
Article History
Received: 19 April 2018
Revised: 11 July 2018
Accepted: 11 July 2018
First Online: 30 December 2019