Deterministic and nondeterministic failure models of LSI circuits exposed to radiation
Crossref DOI link: https://doi.org/10.1134/S1063739715050030
Published Online: 2015-09-02
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Barbashov, V. M.
Trushkin, N. S.
Kalashnikov, O. A.
Text and Data Mining valid from 2015-09-01